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Physical Principles of Electron Microscopy (An Introduction to TEM, SEM, and AEM) (2nd Edition)
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Download Physical Principles of Electron Microscopy (An Introduction to TEM, SEM, and AEM) (2nd Edition) written by R.F. Egerton in PDF format. This book is under the category Technology & Engineering and bearing the isbn13 numbers 3319398768/9783319398761. You may reffer the table below for additional details of the book. We do NOT provide access codes, we provide eBooks ONLY. Instant access will be granted as soon as you complete the payment.
Additional information
| book-author | R.F. Egerton |
|---|---|
| publisher | Springer |
| file-type | |
| pages | 207 |
| language | English |
| isbn10 | 3319398768 |
| isbn13 | 9783319398761 |
| year | 2016 |
Specifications
| book-author | R.F. Egerton |
|---|---|
| publisher | Springer |
| file-type | |
| pages | 207 |
| language | English |
| isbn10 | 3319398768 |
| isbn13 | 9783319398761 |
| year | 2016 |
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